UHV LT STM System USM1200

Features:

• High Stability Operation at 4K
• High resolution STM
• Tunneling Spectroscopy (STS, IETS)
• AFM (tunig fork), MFM, EFM, KFM
• Optical Access by Fibre or Lens Stage
• Tip Enhanced Raman Spectroscopy (TERS) Option
• In-situ Deposition of Metals or Organic Materials

---

STM

Scan Range at RT

( X / Y / Z) = ( 4 / 4 / 0.35 ) μm

Scan Range at 4K

( X / Y / Z) = ( 1 / 1 / 0.1 ) μm

Coarse Range

( X / Y / Z) = ( 2 / 2 / 5 ) mm

UHV System

Load Lock Chamber, Preparation Chamber, STM Chamber

Base Pressure

below 1.3 x 10^-8Pa ( 1.3 x 10^-10mBar )
Load Lock 5 x 10^-5Pa ( 5 x 10^-7mBar )

Options

E-Beam Heating for sample and tip
Argon Ion Sputter Source
Metal and Organic Deposition Sources