The stability of STM measurements is greatly influenced by the quality of the probe. Namely, good STM measurement results often cannot be obtained due to variances in the probe tip diameter, contamination of the probe surface, or flaws in cleaning process. UNISOKU has successfully developed nickel and platiniridium STM probes using an electropolishing method that can solve these problems by yielding fine tip diameters with minimal contamination. Our metal probes allow you to experience a higher level of stability than it was possible in the past. Our conventional tungsten probes are also still available.
All UNISOKU Probes are manufactured and quality controlled to highest standards. Specialised versions are available for STM as well as for MultiProbe contact measurements.
Common features to all Probes are
Order Code | P-100WS |
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Material | Polycrystalline Tungsten 0.25 mm dia. |
Finish | electro-polishing |
Apex Radius | <35 nm |
Application | STM measurement |
Note | removal of oxide layer requires in situ treatment. |
Order Code | P-50 PtIr |
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Material | poly crystalline PtIr 0.50 mm dia. |
Finish | mechanical grind |
Apex Radius | about 50 nm typical |
Application | STM measurement/multi-probe electrical contact measurement |
When time-to-results matters, then the extra expense for these high performance probes is justified. Particularly in Low Temperature STM the overhead times for trying various tips can be disruptive for the experiment. These probes deliver better yield and reproducibility with fewer trials.
Order Code | P-100PtIr(S) |
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Material | poly crystalline PtIr 0.50 mm dia. |
Finish | electro-polishing after mechanical grind |
Apex Radius | <20 nm (sample SEM inspected) |
Application | STM, low temperature, spectroscopy(for multi-probe electrical measurements use especially selected probes: P-100PtIr(P)) |